It can periodically measure contaminants, including water and oxygen, down to parts per trillion (ppt) levels in one location.
Measurement of H2, O2, N2, CH4, CO, CO2 & NMHC in Oxygen, Argon & Other Gases without FID and hydrogen
Analysis of H2, O2, N2, CH4, CO, CO2 in Argon.
Analysis of H2, Ne, O2+Ar, N2, Kr, CH4, CO, CO2 and Xe in Helium, Argon, Hydrogen, Nitrogen, Oxygen, Carbon Dioxide, Krypton and Xenon with the DID technology.
Analysis of H2, O2+Ar, N2, CH4, CO and CO2 in PPB level.
Analysis of CH4, CO, CO2 & NMHC in PPB
Analysis of H2, O2, Ar, N2, CH4, CO, CO2, Kr, Ne, Xe, He in % level.
Binary Gas Analzyer - Control of pure gases and gas mixtures
Total Hydrocarbon Analzyer Continuous analysis of THC in PPM and PPB level
Trace Nitrogen Analyzer for Argon and Helium
Trace Oxygen Analyzer – Control of pure gases and gas mixtures
Using highly accurate Gas Chromatography techniques, the Chroma is capable of trace measurements at part-per-million, parts-per-billion, or percentage levels in a range of background gases.
The MonoExact DF150E utilizes Servomex’s tried and tested Coulometric sensor for reliable, accurate O2 measurements.
The MonoExact DF310E provides digital Coulometric sensing for O2 measurements, with the capability to fit a Paramagnetic sensor for % O2. It can also connect to the AquaXact 1688 Aluminum Oxide sensor for simultaneous O2 and H2O monitoring.
Using proven Coulometric sensing, the DF-550E delivers exceptional O2 measurements at trace and ultra-trace levels.
With a Lower Detection Limit (LDL) of 45 parts-per-trillion (ppt), the DF-560E provides the semiconductor industry with industry-best oxygen (O2) measurements for quality control in ultra-high-purity (UHP) electronic grade gas.
With TDL sensing technology and a robust Herriot Cell, the DF-745 deliver trace and ultra-trace moisture measurements with a Lower Detection Limit of 1ppb.
A Tunable Diode Laser (TDL) sensor-based trace moisture analyzer, the DF-745 SGMax is designed for the measurement of diverse gas mixtures in specialty gas blending applications.
The DF-750 is a trace/ultra-trace moisture analyzer optimized for measurements in the ultra-high-purity (UHP) gases used in 300mm semiconductor fabs.
Designed for quality control applications in UHP bulk gases, the compact DF-760E analyzer is a unique solution for the dual measurement of trace and ultra-trace moisture (H2O) and oxygen (O2).
high-performance multi-gas analyzer designed to provide up to four simultaneous gas stream measurements including: oxygen (O2), carbon dioxide (CO2), carbon monoxide (CO), nitrous oxide (N2O), methane (CH4) and moisture (H2O).
The NanoChrome measures the gases in common background gases at ultra-trace levels, for the highest reliability in purity monitoring. Ar, CH4, CO, CO2, H2, N2, NMHC, O2
The analyzer offers extreme measurement sensitivity from parts-per-million (ppm) down to low parts-per-billion (ppb) levels, and negligible matrix effects from permanent gases. Combined with the separating power of gas chromatography, it provides a unique system.
ta7000 series measures impurities at extremely low, parts-per-trillion (ppt) levels, using either a reduction gas detector or flame ionization detector. wo versions are available: the ta7000R provides hydrogen and carbon monoxide measurements, while the ta7000F measures carbon dioxide, methane and non-methane hydrocarbons. Both monitors have a detection limit below 500ppt.
